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Semiconductor memories: technology, testing, and reliabilty

Sharma, Ashok K - Nama Orang;

Provides in depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods, including: memory cell structures and fabrication technologies; application specific memories and architectures; and memory design, fault modeling and test algorithms, limitations, and trade offs.

Ketersediaan

2020904482-3621.397 32 SHA s C/3Perpustakaan Pusat (Koleksi Umum)Tersedia
2020904482-1621.397 32 SHA s C/1Perpustakaan Pusat (Koleksi Tandon)Tersedia namun tidak untuk dipinjamkan - Tersedia (Tidak Dipinjamkan)
2020904482-6621.397 32 SHA s C/6Perpustakaan Pusat (Koleksi Umum)Tersedia
2020904482-5621.397 32 SHA s C/5Perpustakaan Pusat (Koleksi Umum)Tersedia
2020904482-2621.397 32 SHA s C/2Perpustakaan Pusat (Koleksi Umum)Tersedia
2020904482-4621.397 32 SHA s C/4Perpustakaan Pusat (Koleksi Umum)Tersedia

Informasi Detail

Judul Seri -
No. Panggil 621.397 32 SHA s
Penerbit New York, The Institute of Electical and Electronics Engineers Inc,
Deskripsi Fisik xii, 462 hal, ; bibl, ; ind, ; 25 cm
Bahasa English
ISBN/ISSN 0-7803-1114-0
Klasifikasi 621.397 32
Tipe Isi -
Tipe Media -
Tipe Pembawa -
Edisi -
Info Detail Spesifik Bibliografi: hal. 447-449 ; Indeks: hal: 450-462
Versi lain/terkait Tidak tersedia versi lain
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